Next Generation Inspection System – NEXIS R1

The Next Generation Inspection System (NEXIS) is a scalable family of integrated systems for measuring radar cross section (RCS), material studies, antenna measurements, and more. NEXIS builds on the proven InfiniScan product line, adding modular technology building blocks for a tailored system configuration that is perfectly suited for all measurement scenarios; whether on the flightline supporting operational assets, in manufacturing providing quality assurance during production, or during engineering R&D.

With unprecedented collection speed and measurement sensitivity, NEXIS incorporates automated scanning capabilities into a small and agile footprint to unlock productivity that others can’t even come close to while providing the data quality to exceed
mission requirements. NEXIS supports standard measurement profiles of Linear, Circular, and Inverse SAR; and pushes the boundaries with advanced measurement profiles including Squinted SAR, Contour Following, Great Circle Matching, and even
automated 2D Raster Scans for 3D imaging.

NEXIS offers a wide range of frequency coverage with simple, tool-free, interchangeable payloads ranging from VHF to Ka band; each supporting the full polarization matrix as well as external ports for antenna measurements or even bi-static collections. NEXIS comes standard with intuitive data acquisition software and a full suite of data processing tools. Additionally, data from the NEXIS system is output in a standard format that is compatible with pre-processors like SABER and PulSAR, other processing tools like Knowbell, and is even directly compatible with the Signature Diagnostics System (SDS) database.

Sensor Concepts has a rich history of providing field-level verification systems to 5th and now 6th generation platforms. NEXIS is truly a next-generation evolutionary growth product built from over 30 years of field-level measurement experience.